ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,652, issued on May 27, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).
"Methods and non-transitory computer-readable media for inter-metal dielectric reliability check" was invented by Hsien Yu Tseng (Miaoli County, Taiwan) and Wei-Ming Chen (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method and a non-transitory computer readable media for inter-metal dielectric reliability check. The method comprises: receiving an electronic layout, the electronic layout including a first plurality of electrical components in a first layer; determining an internal voltage diffe...