US Patent Issued to Taiwan Semiconductor Manufacturing on May 20 for "Scan chains with multi-bit cells and methods for testing the same" (American, Taiwanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,248, issued on May 20, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Scan chains with multi-bit cells and methods for testing the same" was invented by Mohammed Moiz Khan (San Jose, Calif.) and Sandeep Kumar Goel (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit includes a scan chain comprising a cell structure, wherein the cell structure comprises a first plural number (N) of stages, and each of the stages is configured to store a bit. The circuit includes a second plural number (S) of multiplexers operatively coupled to the scan chain, wherein the S is determined as N M, where the M represe...