US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on May 20 for "Power amplifiers testing system and related testing method" (Taiwanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,263, issued on May 20, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Power amplifiers testing system and related testing method" was invented by Hsieh-Hung Hsieh (Taipei, Taiwan), Wu-Chen Lin (Hsinchu, Taiwan), Yen-Jen Chen (Taipei, Taiwan) and Tzu-Jin Yeh (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing system includes: a dividing circuit configured to receive a testing signal and provide a plurality of input signals according to the testing signal; and a plurality of integrated power-amplifiers coupled to the dividing circuit, each of the plurality of integrated power-amplifiers being ...