US Patent Issued to Taiwan Semiconductor Manufacturing on March 18 for "Test key and semiconductor die including the same" (Taiwanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,255,112, issued on March 18, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Test key and semiconductor die including the same" was invented by Tse-Pan Yang (Hsinchu, Taiwan), Wei Lee (Hsinchu, Taiwan), Kuo-Pei Lu (Hsinchu County, Taiwan) and Jen-Yuan Chang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test key configured to measure resistance of a through semiconductor via in a semiconductor substrate is provided. The test key includes a first resistor, a first conductor, a first probe pad, a second conductor, a second probe pad, a third conductor, a third probe pad, a fourth conductor, and a fourth ...