US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on March 18 for "Calibration method for emulating group III-V semiconductor device and method for manufacturing group III-V semiconductor device" (Taiwanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,262, issued on March 18, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Calibration method for emulating group III-V semiconductor device and method for manufacturing group III-V semiconductor device" was invented by Chia-Chung Chen (Keelung, Taiwan), Shufang Fu (Hsinchu County, Taiwan), Kuan-Hung Liu (Hsinchu, Taiwan), Chiao-Chun Hsu (Hsinchu, Taiwan), Fu-Yu Shih (Hsinchu, Taiwan), Chi-Feng Huang (Hsinchu County, Taiwan) and Chu Fu Chen (Hsinchu County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A calibration method for emulating a Group III-V semiconductor device, a method for determining trap locat...