ALEXANDRIA, Va., June 18 -- United States Patent no. 12,328,956, issued on June 10, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).
"Integrated circuit photodetector" was invented by Chun-Wei Hsu (Hsinchu, Taiwan), Tsai-Hao Hung (Hsinchu, Taiwan), Chung-Yu Lin (Hsinchu, Taiwan) and Ying-Hsun Chen (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes a photodetector. The photodetector includes one or more dielectric structures positioned in a trench in a semiconductor substrate. The photodetector includes a photosensitive material positioned in the trench and covering the one or more dielectric structures. A dielectric layer covers the ph...