US Patent Issued to Taiwan Semiconductor Manufacturing on July 29 for "Systems and methods for systematic physical failure analysis (PFA) fault localization" (Taiwanese Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,374,572, issued on July 29, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Systems and methods for systematic physical failure analysis (PFA) fault localization" was invented by Peng-Ren Chen (Hsinchu, Taiwan), Wen-Hao Cheng (Hsinchu, Taiwan), Jyun-Hong Chen (Hsinchu, Taiwan) and Chien-Hui Chen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systematic fault localization systems and methods are provided which utilize computational GDS-assisted navigation to accelerate physical fault analysis to identify systematic fault locations and patterns. In some embodiments, a method includes detecting a plurality o...