ALEXANDRIA, Va., July 30 -- United States Patent no. 12,376,371, issued on July 29, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).
"Fin Field-Effect Transistor device and method" was invented by Shao-Jyun Wu (New Taipei, Taiwan) and Sheng-Liang Pan (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of forming a semiconductor device includes forming a first dummy gate structure and a second dummy gate structure over a fin; forming a first dielectric layer around the first dummy gate structure and around the second dummy gate structure; removing the first dummy gate structure and the second dummy gate structure to form a first recess and a second recess in ...