ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,569, issued on July 22, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).
"Automatic optical inspection system and method" was invented by I-Hsuan Chen (Taichung, Taiwan), Ying-Hao Wang (Tainan, Taiwan), Chien-Lung Chen (Zhubei, Taiwan), Chien-Chi Tzeng (Hsinchu, Taiwan) and Hu-Wei Lin (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes forming a package component, the package component comprising an integrated circuit die, attaching the package component to a package substrate; placing a heat spreader over the package component and the package substrate to form an integrated circuit package...