US Patent Issued to Taiwan Semiconductor Manufacturing on July 15 for "Impedance measurement circuit and impedance measurement method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,551, issued on July 15, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Impedance measurement circuit and impedance measurement method thereof" was invented by Tsung-Che Lu (Hsinchu, Taiwan), Chin-Ming Fu (Hsinchu County, Taiwan) and Chih-Hsien Chang (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An impedance measurement circuit and an operating method thereof are provided. The impedance measurement circuit includes a current source, a voltage controlled oscillator (VCO), an operation circuit, and a first delay circuit. The current source, electrically connected to a power rail, is able to sink a c...