US Patent Issued to Taiwan Semiconductor Manufacturing on Jan. 27 for "Apparatus and methods for determining wafer characters" (Taiwanese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,538,746, issued on Jan. 27, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Apparatus and methods for determining wafer characters" was invented by Wei-Da Kang (Hsin-Chu, Taiwan) and Wen-Ting Tsai (Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatus and methods for determining wafer characters are disclosed. In one example, an apparatus is disclosed. The apparatus includes: a processing tool configured to process a semiconductor wafer; a device configured to read an optical character disposed on the semiconductor wafer while the semiconductor wafer is located at the apparatus for wafer fabrication; and...