ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,532,533, issued on Jan. 20, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Method for forming semiconductor structure" was invented by Chi-Wei Wu (Hsinchu, Taiwan), Hsin-Che Chiang (Taipei, Taiwan) and Jeng-Ya Yeh (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for forming a semiconductor structure is provided. The method for forming the semiconductor structure includes forming first fin structures and a second fin structures over a substrate, forming a first gate stack and a second gate stack that extend in a first direction across the first fin structures and the second fin structures, r...