ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,532,561, issued on Jan. 20, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING Co. LTD. (Hsinchu, Taiwan).

"Image sensor device and manufacturing method thereof" was invented by Wei-Chao Chiu (Hsinchu, Taiwan), Chun-Wei Chang (Tainan, Taiwan), Ching-Sen Kuo (Taipei, Taiwan) and Feng-Jia Shiu (Hsinchu County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes performing a first lithography process using a first pattern of a first photomask to form a first photoresist pattern on a front side of a device substrate; performing a first implantation process using the first pattern as a mask to form first isolation regions in the device su...