US Patent Issued to Taiwan Semiconductor Manufacturing on Jan. 13 for "Method for testing and repairing memory device" (Taiwanese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,313, issued on Jan. 13, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Method for testing and repairing memory device" was invented by Po-Hao Lee (Hsinchu, Taiwan), Chia-Fu Lee (Hsinchu, Taiwan) and Yu-Der Chih (Hsin-Chu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for testing and repairing a memory device is provided. The memory device includes a memory array having data cells and reference cells arranged along cell rows and cell columns. The data cells are configured to store data, and the reference cells are configured to generate a reference current for reading the data stored in the data cells...