US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Feb. 18 for "System and method of measuring capacitance of device-under-test" (Taiwanese Inventors)

ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,228,598, issued on Feb. 18, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"System and method of measuring capacitance of device-under-test" was invented by Mao-Hsuan Chou (Hsinchu County, Taiwan), Ruey-Bin Sheen (Taichung, Taiwan) and Chih-Hsien Chang (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a system of measuring capacitance of a device-under-test (DUT). The system includes first switch, second switch, and a capacitance measurement device. The first switch is configured to receive a supply voltage. The first and second switches are electrically connected to th...