ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,001, issued on Feb. 10, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).
"ESD protection circuit" was invented by Tao Yi Hung (Hsinchu, Taiwan), Wun-Jie Lin (Hsinchu, Taiwan), Jam-Wen Lee (Hsinchu, Taiwan) and Kuo-Ji Chen (New Taipei, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An ESD clamp circuit has an ESD detection circuit connected between a first terminal and a second terminal, with a first output node and a second output node. The ESD detection circuit is configured to output respective first and second control signals at the first and second output nodes in response to an ESD event. A discharge circuit...