US Patent Issued to Taiwan Semiconductor Manufacturing on Dec. 16 for "Pixel sensor including refraction structures" (Taiwanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,501,732, issued on Dec. 16, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Pixel sensor including refraction structures" was invented by Wei-Lin Chen (Tainan, Taiwan), Chun-Hao Chou (Tainan, Taiwan) and Kuo-Cheng Lee (Tainan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A pixel sensor may include a main deep trench isolation (DTI) structure and one or more sub-DTI structures in a substrate of the pixel sensor to increase the quantum efficiency of the pixel sensor at large incident angles. The one or more sub-DTI structures may be located within the perimeter of the main DTI structure and above a photodiode. The ...