ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,866, issued on Aug. 26, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).
"Method and system for manufacturing a semiconductor device" was invented by Ching-Hai Yang (Taipei, Taiwan) and Yao-Hwan Kao (Hsinchu County, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for manufacturing a semiconductor device includes forming a photoresist layer that includes a photoresist composition over a wafer to produce a photoresist-coated wafer. The photoresist layer is selectively exposed to actinic radiation to form a latent pattern in the photoresist layer. The latent pattern is developed by applying a developer t...