US Patent Issued to Taiwan Semiconductor Manufacturing on Aug. 26 for "Conducting built-in self-test of memory macro" (Canadian, Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,725, issued on Aug. 26, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Conducting built-in self-test of memory macro" was invented by Saman Adham (Kanata, Canada), Marat Gershoig (Ottawa), Vineet Joshi (Hsinchu, Taiwan) and Ted Wong (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors such that at least one input vector of the plurality of input vectors is transmitted to the memory macro in each of a plurality of cycles, receiving in each of the plurality of cycles, an output data from the memory macro...