ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,400,890, issued on Aug. 26, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Apparatus for fabricating a semiconductor device and method for fabricating semiconductor device" was invented by Po-Chien Huang (Hsinchu, Taiwan), Chung-Hung Lin (Tainan, Taiwan) and Chih-Wei Wen (Tainan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for fabricating a semiconductor structure, including disposing a mask at a first position in a first chamber, generating a first plurality of ions toward the mask by an ionizer, forming a photoresist layer on a substrate, receiving the substrate in the first chamber, and exposing...