US Patent Issued to Taiwan Semiconductor Manufacturing on Aug. 12 for "Hot spot defect detecting method and hot spot defect detecting system" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,318, issued on Aug. 12, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Hot spot defect detecting method and hot spot defect detecting system" was invented by Chien-Huei Chen (Kaohsiung, Taiwan), Pei-Chao Su (Hsinchu County, Taiwan), Xiaomeng Chen (Hsinchu County, Taiwan), Chan-Ming Chang (Hsinchu, Taiwan), Shih-Yung Chen (Hsinchu, Taiwan), Hung-Yi Chung (Taoyuan, Taiwan), Kuang-Shing Chen (Hsinchu, Taiwan), Li-Jou Lee (Hsinchu, Taiwan), Yung-Cheng Lin (Hsinchu, Taiwan), Wei-Chen Wu (Hsinchu, Taiwan), Shih-Chang Wang (Hsinchu, Taiwan) and Chien-An Lin (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A h...