ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,211,949, issued on Jan. 28, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan) and NATIONAL TSING HUA UNIVERSITY (Hsinchu, Taiwan).
"Semiconductor detector" was invented by Ya-Chin King (Taipei, Taiwan), Chrong Jung Lin (Hsinchu, Taiwan), Burn Jeng Lin (Hsinchu, Taiwan) and Shi-Jiun Wang (Changhua, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A device includes an active region, an isolation structure, a gate structure, an interlayer dielectric (ILD) layer, a reading contact, and a sensing contact. The isolation structure laterally surrounds the active region. The gate structure is across the active region. The ILD...