ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,298, issued on Oct. 28, was assigned to TAIWAN MASK Corp. (Hsinchu County, Taiwan).
"Test system for testing semiconductor devices" was invented by Chih-Ming Chen (Hsinchu County, Taiwan) and Chih-Kang Toh (Hsinchu County, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test system, for testing a plurality of semiconductor devices, includes a carrying apparatus, an abutting apparatus and a pressing apparatus including a cover and a seat. The cover and the seat constitute a test chamber and a sealed auxiliary chamber. The carrying apparatus is disposed within the test chamber. Each semiconductor device is carried by one of a plurality of test...