US Patent Issued to SYSTEM SQUARE on Sept. 30 for "Training data generation device, inspection device and program" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,739, issued on Sept. 30, was assigned to SYSTEM SQUARE INC. (Niigata, Japan).

"Training data generation device, inspection device and program" was invented by Sachihiro Nakagawa (Nagaoka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A training data generation device includes: cut-out unit that receives an input of an image of an inspection target, specifies an inspection area of the inspection target in the image by a predetermined method, and cuts out the specified inspection area from the image; sorting unit that, on the basis of a sorting operation of sorting, as a learning-target image, an image of the inspection area cut out in the cut...