US Patent Issued to Sysmex on Sept. 30 for "Measurement apparatus and analysis method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,424, issued on Sept. 30, was assigned to Sysmex Corp. (Hyogo, Japan).

"Measurement apparatus and analysis method" was invented by Toshihiro Mizukami (Kobe, Japan), Konobu Kimura (Kobe, Japan), Yuuichi Hamada (Kobe, Japan), Yuji Toya (Kobe, Japan), Noriyuki Nakanishi (Kobe, Japan), Takaaki Nagai (Kobe, Japan), Masato Kuze (Kobe, Japan) and Hironori Tanaka (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a measurement apparatus for analyzing a cell contained in a specimen, comprising: a chamber for preparing a measurement sample in which the cell is stained with first and second fluorescent dyes contained in a reagent supplied...