US Patent Issued to SYSMEX on May 20 for "Method of transporting rack and sample measurement system" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,200, issued on May 20, was assigned to SYSMEX Corp. (Kobe, Japan).

"Method of transporting rack and sample measurement system" was invented by Kouichi Masutani (Kobe, Japan) and Yuji Wakamiya (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample measurement system according to an embodiment may include: sample measurement units that receive supply of containers and perform measurement on samples; a rack setting unit in which a rack storing the containers to be supplied to at least one of the sample measurement units is set; a first transport path that transports the containers from the rack setting unit to at least one of the sample m...