ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,534, issued on March 18, was assigned to Sysmex Corp. (Hyogo, Japan).
"Sample analyzer and sample analysis method" was invented by Kazuma Moriura (Kobe, Japan) and Hiroshi Kurono (Kobe, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a sample analyzer including a storage section configured to store a plurality of containers for containing a sample, and including a discharge port through which the container is discharged; a production lot information acquisition unit that acquires production lot information on a production lot of the container; an analysis processing unit that performs analysis processing of the sample contained in...