US Patent Issued to SYSMEX on July 1 for "Sample measuring apparatus, reagent container, and method of measuring sample" (Japanese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,724, issued on July 1, was assigned to SYSMEX Corp. (Kobe, Japan).

"Sample measuring apparatus, reagent container, and method of measuring sample" was invented by Yutaka Kawamoto (Kobe, Japan), Tomohiro Kuroiwa (Kobe, Japan) and Shingo Kaida (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample measuring apparatus, A reagent container, and a method of measuring a sample are provided. The sample measuring apparatus includes: a container holding unit that holds a reagent container comprising an openable/closable lid portion that covers an opening of the reagent container; a reagent dispensing unit that aspirates a reagent in the reagent ...