US Patent Issued to SYSMEX on Jan. 20 for "Image analysis method, apparatus, program, and learned deep learning algorithm" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,912, issued on Jan. 20, was assigned to SYSMEX Corp. (Kobe, Japan).

"Image analysis method, apparatus, program, and learned deep learning algorithm" was invented by Yosuke Sekiguchi (Kobe, Japan), Kazumi Hakamada (Kobe, Japan), Yuki Aihara (Kobe, Japan), Kohei Yamada (Kobe, Japan), Kanako Masumoto (Kobe, Japan) and Krupali Jain (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides an image analysis method for generating data indicating a region of a cell nucleus in an image of a tissue or a cell. The image analysis method is a method for analyzing an image of a tissue or a cell using a deep learning algorithm of ...