US Patent Issued to Sysmex on Dec. 9 for "Control method for test system, control method for smear preparation device, test system, and smear preparation device" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,492,970, issued on Dec. 9, was assigned to Sysmex Corp. (Hyogo, Japan).

"Control method for test system, control method for smear preparation device, test system, and smear preparation device" was invented by Daiki Kawakami (Kobe, Japan), Seiya Shinabe (Kobe, Japan) and Tomoyuki Asahara (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a control method for a test system including a smear imaging unit configured to image a smear of a specimen, the control method including: preparing a plurality of the smears; sequentially storing, in a storing container capable of storing therein a plurality of the smears, the smears having been pre...