US Patent Issued to Syntegon Technology on Feb. 4 for "Learning process device and inspection device" (Japanese Inventor)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,217,495, issued on Feb. 4, was assigned to Syntegon Technology K.K. (Tokyo).

"Learning process device and inspection device" was invented by Ken Wada (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A learning processing device that is based on a neural network model and image data obtained by capturing an image of the object to be inspected, and constructs the neural network model used for inspecting the object to be inspected. The learning processing device is provided with a learning unit which performs a learning process under a prescribed learning condition on the basis of a list of the image data including a plurality of learning images and co...