ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,446,215, issued on Oct. 14, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"One-time programmable bitcell with a thermally enhanced rupture" was invented by Andrew Edward Horch (Seattle), Larry Y. Wang (San Jose, Calif.) and WenKai Hung (Zhubei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A current may be passed through a channel of an anti-fuse field-effect transistor (FET) to increase a temperature of a gate dielectric of the anti-fuse FET and change a rupture voltage of the gate dielectric of the anti-fuse FET from a first rupture voltage to a second rupture voltage. The gate dielectric may be ruptured by applying a first voltage betwee...