US Patent Issued to Synopsys on June 3 for "Distributed test pattern generation and synchronization" (Vermont, California Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,839, issued on June 3, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Distributed test pattern generation and synchronization" was invented by Peter Wohl (Williston, Vt.), Khader Abdel-Hafez (Sunnyvale, Calif.) and Michael Dylan Dsouza (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for performing efficient automatic test-pattern generation (ATPG) are disclosed. ATPG may be performed by ATPG workers whose fault states are synchronized by an ATPG manager. In some embodiments, test-pattern generation by a ATPG worker may be performed multiple times with minimal idle time between generation and fault simulation interval...