US Patent Issued to Synopsys on June 17 for "Measuring device defect sensitization in transistor-level circuits" (California, North Carolina Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,301, issued on June 17, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Measuring device defect sensitization in transistor-level circuits" was invented by Mayukh Bhattacharya (Palo Alto, Calif.), Jonti Talukdar (Durham, N.C.), Shan Yuan (San Jose, Calif.) and Huiping Huang (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining defect sensitization includes parsing a netlist of a circuit design to determine a plurality of potential defects and partitioning the circuit design into a plurality of blocks. The method also includes generating a graph representing the circuit design and determining a transitive closur...