US Patent Issued to Synopsys on June 17 for "Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QoR)" (California, Illinois Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,227, issued on June 17, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QoR)" was invented by Apik A. Zorian (Santa Clara, Calif.), Fadi Maamari (San Jose, Calif.), Suryanarayana Duggirala (San Jose, Calif.), Mahilchi Milir Vaseekar Kumar (San Jose, Calif.) and Basim Mohammed Issa Shanyour (Carbondale, Ill.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A first set of features may be extracted from a first integrated circuit (IC) design. A trained machine learning (ML) model may predict a set of ranked tes...