ALEXANDRIA, Va., July 9 -- United States Patent no. 12,353,307, issued on July 8, was assigned to Synopsys Inc. (Sunnyvale, Calif.).
"Random instruction-side stressing in post-silicon validation" was invented by Hillel Mendelson (Melbourne, Australia) and Tom Kolan (Haifa, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method including: providing a test template for a hardware system-under-test comprising one or more execution threads, wherein the test template comprises a branching instruction to a predetermined shared memory address accessible by at least some of the one or more execution threads; generating and storing, at the predetermined shared memory address, a sequence o...