US Patent Issued to Synopsys on Jan. 20 for "Maximizing detectable defect coverage of analog circuits in integrated circuit design" (California Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,515, issued on Jan. 20, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Maximizing detectable defect coverage of analog circuits in integrated circuit design" was invented by Mayukh Bhattacharya (Palo Alto, Calif.), Huiping Huang (San Jose, Calif.), Mihir Sherlekar (Mountain View, Calif.) and Michael Durr (Mountain View, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method are provided for detectability analysis to identify defective analog components of a circuit. The method includes applying detectability analysis stimuli to the circuit for the purpose of identifying all detectable defects within a defect universe of the c...