ALEXANDRIA, Va., June 5 -- United States Patent no. 12,277,372, issued on April 15, was assigned to Synopsys Inc. (Sunnyvale, Calif.).
"Multi-cycle test generation and source-based simulation" was invented by Peter Wohl (Williston, Vt.) and John A. Waicukauski (Tualatin, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method generates test patterns for simulating a circuit design. Generating the test patterns includes determining clock data of the circuit design. The clock data is determined by determining a first clock signal pair from clock signals, and determining a disturb cell based on the first clock signal pair. The disturb cell is electrically coupled to a first clock signal of the f...