ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,181, issued on June 17, was assigned to SUN YANG OPTICS DEVELOPMENT Co. LTD. (Taoyuan, Taiwan).
"Dual lens inspection device" was invented by Sheng Che Wu (Taoyuan, Taiwan), Sheng Da Jiang (Taoyuan, Taiwan) and Yu Hung Chou (Taoyuan, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A dual lens inspection device, having a low power lens group satisfies the condition value of 3.0less than=magnificationless than=1.0; a high power lens group, satisfies the condition value of 25.0less than=magnificationless than=15.0; a light source module projecting an illumination light source to the low power lens group and the high power lens group; a beam split...