US Patent Issued to Sumitomo Electric Industries on Oct. 7 for "Measurement pattern, measurement pattern set, calculation method, non-transitory computer-readable recording medium and calculation device" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,182, issued on Oct. 7, was assigned to Sumitomo Electric Industries Ltd. (Osaka, Japan).

"Measurement pattern, measurement pattern set, calculation method, non-transitory computer-readable recording medium and calculation device" was invented by Ken Kikuchi (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a measurement pattern for measuring a high frequency characteristic of a first element including a first input electrode, a first output electrode, and a first reference electrode. The measurement pattern includes a second element including a second input electrode having a planar shape corresponding to ...