ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,611, issued on Jan. 20, was assigned to Strain Measurement Devices Inc. (Wallingford, Conn.).
"Instrumented pin sensor" was invented by Daniel Shapiro (Brandford, Conn.), Neal Wostbrock (North Haven, Conn.), William Easlea (Suffolk, Great Britain), Eduard Krutyanskiy (Middlebury, Conn.) and Chris Bowman (Suffolk, Great Britain).
According to the abstract* released by the U.S. Patent & Trademark Office: "An instrumented pin sensor includes: a support body in the form of a pin having an axial cross section that is only partially circular, forming a first outer surface with a profile that follows the partially circular axial cross section, and a second outer surface with a profile t...