ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,946, issued on March 4, was assigned to STMicroelectronics S.r.l. (Agrate Brianza, Italy).
"Capacitor measurement" was invented by Davide Argento (Milan), Orazio Pennisi (Pieve Emanuele, Italy), Stefano Castorina (Milan), Vanni Poletto (Milan), Matteo Landini (Bareggio, Italy) and Andrea Maino (Novara, Italy).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for measuring a capacitance value of a capacitor are provided. In embodiments, a resistor is coupled to a terminal of the capacitor. A difference in voltage at the terminal between a first time and a second time during a discharge routine of the capacitor is measured. The dischar...