US Patent Issued to STMicroelectronics on March 11 for "Method for producing a probe used for testing integrated electronic circuits" (Italian Inventor)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,248,012, issued on March 11, was assigned to STMicroelectronics S.r.l. (Agrate Brianza, Italy).

"Method for producing a probe used for testing integrated electronic circuits" was invented by Alberto Pagani (Nova Milanese, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "Cantilever probes are produced for use in a test apparatus of integrated electronic circuits. The probes are configured to contact corresponding terminals of the electronic circuits to be tested during a test operation. The probe bodies are formed of electrically conductive materials. On a lower portion of each probe body that, in use, is directed to the respective terminal to be co...