US Patent Issued to STMicroelectronics on Feb. 4 for "Photonic wafer level testing systems, devices, and methods of operation" (Italian Inventors)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,216,020, issued on Feb. 4, was assigned to STMicroelectronics S.r.l. (Agrate Brianza, Italy).

"Photonic wafer level testing systems, devices, and methods of operation" was invented by Marco Piazza (Milan), Antonio Canciamilla (Olgiate Olona, Italy), Piero Orlandi (Arcevia, Italy) and Luca Maggi (Garlate, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing a photonic device includes providing a plurality of optical test signals at respective inputs of a first plurality of inputs of an optical input circuit located on a substrate, combining the plurality of optical test signals into a combined optical test signal at an output of the op...