ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,560, issued on Dec. 30, was assigned to STMICROELECTRONICS S.r.l. (Agrate Brianza, Italy).
"Micromechanical device for enhanced acceleration measurement" was invented by Gabriele Gattere (Castronno, Italy), Francesco Rizzini (Passirano, Italy) and Nicolo' Manca (Turin, Italy).
According to the abstract* released by the U.S. Patent & Trademark Office: "Micromechanical device comprising: a semiconductor body; a movable structure configured to oscillate relative to the semiconductor body along an oscillation direction; and an elastic assembly with an elastic constant, coupled to the movable structure and to the semiconductor body and configured to deform along the oscillation direct...