US Patent Issued to STMicroelectronics International on Sept. 2 for "Reset for scan mode exit for devices with power-on reset generation circuitry" (Indian Inventor)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,305, issued on Sept. 2, was assigned to STMicroelectronics International N.V. (Geneva).

"Reset for scan mode exit for devices with power-on reset generation circuitry" was invented by Shikhar Makkar (Faridabad, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for performing scan testing on a device core uses a test access port (TAP). The TAP includes a test clock (TCK) pin, a test data in (TDI) pin, and a test mode select (TMS) pin, along with a test control register (TCR) associated with it. The TCR is used to set a scan mode signal, which configures the scan flip flops within the device core for scan testing and performs the scan test...