US Patent Issued to STMicroelectronics International on Oct. 7 for "Method and architecture for serial link characterization by arbitrary size pattern generator" (Indian Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,853, issued on Oct. 7, was assigned to STMicroelectronics International N.V. (Geneva).

"Method and architecture for serial link characterization by arbitrary size pattern generator" was invented by Ankur Bal (Greater Noida, India) and Rupesh Singh (Ghaziabad, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A serial-connection is tested by transmitting a PRBS generated using a kth-order monic-polynomial from transmission-circuitry to reception-circuitry, and determining operation is proper based upon the PRBS received. The PRBS is formed by generating x intermediate-words of the PRBS, x being a result of an integer-divide between a total number o...