US Patent Issued to STMicroelectronics International on Oct. 21 for "Low overhead loop back test for high speed transmitter" (Indian Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,478, issued on Oct. 21, was assigned to STMicroelectronics International N.V. (Geneva).

"Low overhead loop back test for high speed transmitter" was invented by Rupesh Singh (Ghaziabad, India) and Ankur Bal (Greater Noida, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes a serializer configured to receive first test data in n-bit words and to generate a single bit data stream by serializing the test data in accordance with a first clock signal. The integrated circuit includes testing circuitry configured to test the serializer without utilizing a deserializer."

The patent was filed on Feb. 13, 2023, under Applicat...