US Patent Issued to STMicroelectronics International on Nov. 4 for "On chip test architecture for continuous time delta sigma analog-to-digital converter" (Indian Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,658, issued on Nov. 4, was assigned to STMicroelectronics International N.V. (Geneva).

"On chip test architecture for continuous time delta sigma analog-to-digital converter" was invented by Ankur Bal (Greater Noida, India), Abhishek Jain (Delhi, India) and Sharad Gupta (New Delhi).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes a continuous time delta sigma analog-to-digital converter (CTDS ADC) and a test circuit for testing the CTDS ADC. The test circuit converts multibit digital reference data to a single-bit digital stream. The test circuit then passes the single-bit digital stream to a finite impulse response digita...