US Patent Issued to STMicroelectronics International on Nov. 25 for "Programmable delay testing circuit" (Italian Inventor)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,989, issued on Nov. 25, was assigned to STMicroelectronics International N.V. (Geneva).

"Programmable delay testing circuit" was invented by Filippo Colombo (Monza, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes a test circuit, and an analog delay circuit and a sampler register, each configured to receive a signal. The delay circuit includes a configuration input and phases with a final phase. The sampler register includes result outputs and delay inputs that are each coupled to a respective delay output of the phases. The sampler register is configured to output a sample signal indicating a relationship between ...